Data mining and diagnosing ic fails
by
Huisman, Leendert M
.
Publisher: New York: Springer, 2005Description: xiv, 270p.ISBN: 0387249931.Subject(s): Data mining![](/opac-tmpl/prog/images/filefind.png)
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Item type | Location | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
621.381548 HUD (Browse shelf) | Available | 110114 |
Total holds: 0
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621.38154 OPT Transducers 1 temperature,displacement,force,torque,pressure | 621.381548 AMP Principles of semiconductor network testing | 621.381548 HND Digital integrated circuit testing from a quality perspective | 621.381548 HUD Data mining and diagnosing ic fails | 621.381548 ROU Use of the oscilloscope | 621.3815483 BAH Howard w. Sams oscilloscope guide | 621.3815486 GOD Digital techniques in frequency synthesis |
HB
Eng
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