Digital integrated circuit testing from a quality perspective
by
Hnatek, Eugene R
.
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Item type | Location | Call number | Status | Date due | Barcode | Item holds |
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Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
621.381548 HND (Browse shelf) | Available | 87147 |
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621.38154 OPT Transducers 2 acceleration, vibration, velocity, flow | 621.38154 OPT Transducers 1 temperature,displacement,force,torque,pressure | 621.381548 AMP Principles of semiconductor network testing | 621.381548 HND Digital integrated circuit testing from a quality perspective | 621.381548 HUD Data mining and diagnosing ic fails | 621.381548 ROU Use of the oscilloscope | 621.3815483 BAH Howard w. Sams oscilloscope guide |
HB
Eng
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