Random testing of digital circuits : theory and applications
by David, Rene.
Material type: BookPublisher: New York: Marcel Dekker, 1998Description: xix, 475p.ISBN: 0824701828.Subject(s): Digital integrated ciruits-TestingItem type | Location | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books |
Central Library AIOU Islamabad
General Stacks
Allama Iqbal Open UniversityCentral Library |
621.3815 DAR (Browse shelf) | Available | 86959 |
Total holds: 0
HB
Eng
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